« High Structural and Optical quality of III-V-on-Si 1nm-thick oxide-bonded Hybrid Interface » Anne Talneau , Grégoire Beaudoin , David Alamarguy and Gilles Patriarche, Microelectronic Engineering Volume 192 Issue C, May 2018
« An ultra-thin SiO2 ALD layer for void-free bonding of III–V material on silicon » A.Talneau, K.Pantzas, A.Durnez, G.Patriarche, D.Alamarguy and E.Le Bourhis Microelectronic Engineering, (2016), pp. 40-44, DOI: 10.1016/j.mee.2016.05.001
Oxide-Free Bonding of III-V-Based Material on Silicon and Nano-Structuration of the Hybrid Waveguide for Advanced Optical Functions” Konstantinos Pantzas, Ahmad Itawi, Isabelle Sagnes, Gilles Patriarche, Eric Le Bourhis, Anatole Lupu, Henri Benisty and Anne Talneau Photonics 2015, 2, 1054-1064; doi:10.3390/photonics2041054
"Biperiodic nanostructured waveguides for wavelength-selectivity of hybrid photonic devices," A. Talneau, X. Pommarède, A. Itawi, K. Pantzas, A. Lupu, and H. Benisty, Optics Letters, vol. 40(22) , pp. 5148-5151, 2015
K. Pantzas, E. Le Bourhis, G. Patriarche, D. Troadec, G. Beaudoin, A. Itawi, I. Sagnes, and A. Talneau, “Locally measuring the adhesion of InP directly bonded on sub-100 nm patterned Si” Nanotechnology, 27, 11 115707 (2016) doi:10.1088/0957-4484/27/11/115707
Bonding mechanism of a yttrium iron garnet film on Si without the use of an intermediate layer , K. Pantzas, G. Patriarche, A. Talneau, J. Ben Youssef, Appl. Phys. Lett. 105, 141601 (2014)
Embedded Effective-Index-Material in Oxide-Free Hybrid Silicon Photonics Characterized by Prism Deviation , K. Bougot-Robin, C. Pang, X. Pommarede, A. Itawi, A. Talneau, J.-P. Hugonin, H. Benisty, J. Lightwave Technol. 32, 3283 (2014)
Low-index nanopatterned barrier for hybrid oxide-free III-V silicon conductive bonding , K. Bougot-Robin, A. Talneau, H. Benisty, Optics Express 22, 23333 (2014)
Void-free direct bonding of InP to Si: Advantages of low H-content and ozone activation , A. Itawi, K. Pantzas, I. Sagnes, G. Patriarche, A. Talneau, J. Vac. Sci. Technol. B 32, 21201 (2014)
Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements , C. Pang, H. Benisty, M. Besbes, X. Pommarede, A. Talneau, J. Lightwave Technol. 32, 1048 (2014)
Evaluation of the surface bonding energy of an InP membrane bonded oxide-free to Si using instrumented nanoindentation , K. Pantzas, G. Patriarche, E. Le Bourhis, D. Troadec, A. Itawi, G. Beaudoin, I. Sagnes, A. Talneau, Appl. Phys. Lett. 103, 81901 (2013)
Atomic-plane-thick reconstruction across the interface during heteroepitaxial bonding of InP-clad quantum wells on silicon , A. Talneau, C. Roblin, A. Itawi, O. Mauguin, L. Largeau, G. Beaudoin, I. Sagnes, G. Patriarche, , 130 (2013)
A.Cattoni , A.Talneau , A.M. Haghiri-Gosnet , J.Girard and A.Sentenac “Extremely thin planarized grating for sub-diffraction (<100nm) far-field imaging of living cell membranes” Microelectron. Eng. (2012) DOI information: 10.1016/j.mee.2012.02.038
A.Talneau, F. Lemarchand, J.Girard, A.L. Fehrembach, A. Sentenac “Deeply-etched two-dimensional grating in a Ta2O5 guiding layer for very narrow spectral filtering”, A, Microelectron. Eng. 87, 1360 (2010)
A. Talneau, I. Sagnes, R. Gabet, Y. Jaouen, and H. Benisty “Ultrasharp edge filtering in nanotethered photonic wires” Appl. Phys. Lett., 97, 191115 (2010)
Anne Talneau “Slow light modes for optical delay lines implementation: 2D Photonic Crystal-based structures, performances and challenges”, invited contribution, Journal of Optics, 12 , 104005 (2010)
A.Talneau, F. Lemarchand “Deeply-etched two-dimensional grating in a Ta2O5 guiding layer for very narrow spectral filtering “, Microelectron. Eng. 87, 1360 (2010)
A. Talneau, F. Lemarchand, A.L. Fehrembach, A. Sentenac “Impact of electron-beam lithography irregularities across millimeter-scale resonant grating filter performances “ , Appl. Opt. 49, 658 (2010)
A. Talneau “Slowing down the light for delay lines implementation: Design and performance,”, C.R. Phys. 10, (2009)
Collaboration
III-V on CaF2: a possible waveguiding platform for mid-IR photonic devices” Ngoc-Linh Tran, Mario Malerba, Anne Talneau, Giorgio Biasiol, Oussama Ouznali, Adel Bousseksou, Jean-Michel Manceau, and Raffaele Colombelli Opt. Express 27(2), 1672-1682 (2019) doi.org/10.1364/OE.27.001672
Low-temperature intrinsic plasticity in silicon at small scales” A. Merabet, M. Texier, C. Tromas, S.Brochard, L. Pizzagalli, L. Thilly, J. RabierA. Talneau, Y.-M. Le Vaillant, O. Thomas, J. Godet
Acta Materialia 161 (2018) 54-60
Multi-wavelength multi-angle reflection tomography” Ting Zhang, Kévin Unger, Guillaume Maire, Patrick C. Chaumet, Anne Talneau, Charan Godhavarti, Hugues Giovannini, Kamal Belkebir, and Anne Sentenac Optics Express Vol. 26, Issue 20, pp. 26093-26105 (2018) •https://doi.org/10.1364/OE.26.026093
Phase imaging and synthetic aperture super-resolution via total internal reflection microscopy » G.Maire, H.Giovannini, A.Talneau, P.Chaumet, K.Belkebir and A.Sentenac Optics Letters Vol 43, N°9, May 2018
Far-field diffraction microscopy at lambda/10 resolution » Ting Zhang, Charan Godhavarti, Patrick C. Chaumet, Guillaume Maire, Hugues Giovannini, Anne Talneau, Marc Allain, Kamal Belkebir, Anne Sentenac Optica 3(6), 609-612 (2016) http://dx.doi.org/10.1364/OPTICA.3.000609
Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure” A. I. Pateras, M. Allain, P. Godard, L. Largeau, G. Patriarche, A. Talneau, K. Pantzas, M. Burghammer, A. A. Minkevich, and V. Chamard Phys. Rev. B 92, 205305 – Published 13 November 2015 http://dx.doi.org/10.1103/PhysRevB.92.205305
Superresolution with full-polarized tomographic diffractive microscopy” Charankumar Godavarthi, Ting Zhang, Guillaume Maire, Patrick C. Chaumet, Hugues Giovannini,Anne Talneau, Kamal Belkebir, and Anne Sentenac Vol. 32, No. 2 / February 2015 / J. Opt. Soc. Am. A http://dx.doi.org/10.1364/JOSAA.32.000287
Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography » V. Chamard, M. Allain, P. Godard, A. Talneau, G. Patriarche & M. Burghammer SCIENTIFIC REPORTS | 5 : 9827 | DOI: 10.1038/srep09827
Tomographic Diffractive Microscopy with agile illuminations for imaging targets in a noisy background » T. Zhang, C. Godavarthi, P. C. Chaumet, G. Maire, H. Giovannini, A. Talneau, C. Prada, A. Sentenac, , and K. Belkebir OPTICS LETTERS February 15, 2015 / Vol. 40, No. 4 / 573,
Full-polarized Tomographic Diffraction Microscopy Achieves a Resolution about One-Fourth of the Wavelength , T. Zhang, Y. Ruan, G. Maire, D. Sentenac, A. Talneau, K. Belkebir, P.C. Chaumet, A. Sentenac, Phys. Rev. Lett. 111, 243904 (2013)
X-ray lensless microscopy from undersampled diffraction intensities , F. Berenguer, P. Godard, M. Allain, J.-M. Belloir, A. Talneau, S. Ravy, V. Chamard, Phys. Rev. B 88, 144101 (2013)
High-resolution tomographic diffractive microscopy in reflection configuration , G. Maire, Y. Ruan, T. Zhang, P.C. Chaumet, H. Giovannini, D. Sentenac, A. Talneau, K. Belkebir, A. Sentenac, J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 30, 2133 (2013)
Nanometric Resolution with Far-Field Optical Profilometry , S. Arhab, G. Soriano, Y. Ruan, G. Maire, A. Talneau, D. Sentenac, P.C. Chaumet, K. Belkebir, H. Giovannini, Phys. Rev. Lett. 111, 53902 (2013)
Far-Field Optical Control of a Movable Subdiffraction Light Grid [PDF] , J.-C. Girard, G. Scherrer, A. Cattoni, E. Le Moal, A. Talneau, B. Cluzel, F. de Fornel, A. Sentenac, Phys. Rev. Lett. 109, 187404 (2012)
Y. Ruan, P. Bon,; E. Mudry, G. Maire; P. C. Chaumet, H. Giovannini, K. Belkebir, A. Talneau, B. Wattellier, S. Monneret, and A. Sentenac » Tomographic diffractive microscopy with a wavefront sensor » Opt. Lett., 37,1631 (2012)
Y. Bourgin, Y. Jourlin, O. Parriaux, A. Talneau, S. Tonchev, C. 2. Veillas, P. Karvinen, N. Passilly, A.R. Md Zain, R.M. De La Rue, J. Van Erps, D. Troadec « 100 nm period grating by high-index phase-mask immersion lithography » , , Optics Express 10, 10557 (2010)
Jules Girard, Guillaume Maire, Hugues Giovannini, Anne Talneau, Kamal Belkebir, Patrick C. Chaumet, and Anne Sentenac « Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime” Physical Review A 82, 061801(R) (2010)
A.L. Fehrembach, F. Lemarchand, A. Talneau, A. Sentenac, A. Lemarchand, J. Girard, « High Q Polarization Independent Guided-Mode Resonance Filter With “Doubly Periodic” Etched Ta2O5 Bidimensional Grating » , J. Lightwave Technol. 28, 2037 (2010)
N. Le Thomas, H. Zhang, J. Jagerska, V. Zabelin, R. Houdré, I. Sagnes, A. Talneau « Light transport regimes in slow light photonic crystal waveguides « , Phys. Rev. B 80, 125332 (2009)
